Operation of IFD™ TechnologyThe numbers of circuits or channels, called Test Points, that can be simultaneously tested is virtually unlimited and these Test Points are installed increments of 256-channel in what is deemed a tester-module. Up to 5 modules or 1280 test channels fit into one 7U-rack-mount space as a Pod and up to 64 tester-modules can be linked together and operated using a single CC.
The IFD™ Technology's sophisticated programmable switching circuitry allows dynamic circuit adaptation and other programmable, point to point, or point to multi-point tests using a variety of third-party instruments; even integration with other ATE fully achievable. An Ethernet LAN port, USB, SPI communications and dedicated GPIO outputs, on the various variants of the IFD™ Technology, enabled fast switching of pairs of Test Points, complex pre & post commands to Smart Interface Adapters (SIA), and with routing to either internal or external instrumentation.
The advanced switching board within the IFD™ Technology has the ability to automatically ‘ground’ unused test points and, during testing, ‘ground’ known intermittent test points while simultaneously and continually testing for other failures which may be occurring on other test points during a single test period.
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