Intermittent events may occur across the whole of a testing profile, and they may occur at particular environmental stimulus; if being rotated at part of the test, this could be at a particular angular position. The IFD™ Technology is optimised for detecting and isolating these events as soon at they happen, and then they are passed to the CC for processing, display and recording. However, the CC can add in a slight delay on the reported time depending on the OS of the CC, the processing time, GUI interaction and so it might be beyond the event time (microsecond as most). However, if the UUT is in motion ie the UUT was say a slip-ring assembly and it was being tested while being rotated, then it would be important to determine when the event happened and correlate each event with angular position and other environmental parameters. Even with a dedicated COM Port, coordinating this event data with the computer controlling the environmental stimulus (which may include a turntable) could result in timing issues and key event data being misaligned. The Signal Module is directly coupled to the IFD™ hardware's FPGA with a ESD protected direct output from the IFD™ TE to the ITA. This allows a secondary computer/microprocessor to to linked to directly to the Signal Module and say an angular position sensor on the turntable, so that event data can be correlated effectively. When a event occurs, the Signal Module outputs a direct specific signal that can be quickly processed and this can be used to linked with key environmental parameters.
For more details on this option, design of suitable ITA and appropriate secondary computer, its implementation and data capture, please contact your Authorised Distributor.
