Testing Parameters

Set the test duration in minutes for Intermittence testing.  This time may need to reflect the time needed to stimulate the UUT or perform environmental stress cycles, such temperature or humidity cycling.  The test can be paused at anytime during the test time set without loss of test data.

 

Sets the level of sensitivity for the Intermittence Test.   It ranges from 1 to 255 with 255 being the maximum sensitivity.  If the sensitivity is set too high, the system may respond to variations that could be attributed to just ambient ‘noise’.  Set the sensitivity low initially to capture more frequent intermittency, and then consider increasing the sensitivity gradually in steps to continue detecting faults while remaining low enough to prevent reaching the ambient ‘noise’ level.  The Rate of change for increasing both Sensitivity and Drive values can also be set to Fast/Med/Slow; there is no Rate of change for decreasing these parameters. 'Med' is set as the default.

Set the drive level from a range of 1 to 255, with 255 equating to a maximum voltage of 3.2volts.  The drive level is the amount of voltage applied to the UUT as the analogue stimuli; the maximum current is shown in milliamps and can only be a maximum of 1.1mA.  The Rate of change for increasing this parameter is as described for Sensitivity.

 

Set the resolution of the Scope points plotted in the Scope area on the Legacy Intermittence Test screen.  For Fast mode, the Scope Points are limited to a maximum of 150.

Sets the number of events (glitches) that are captured and displayed prior to automatically grounding the associated test point; this allows the IFD™ TE to spend valuable time processing and displaying new events from other TPs, rather than the CC being tied up processing intermittent faults that have been detected and isolated.

This parameter is only relevant to Legacy Intermittence, and has the following modes of operation: 

 

The IFD™ TE has a number of sound modes available.  This includes a built-in synthesized voice option, which will call out the nomenclature of those failing test points as they occur.  Set to Voice for this option (USB sound output is required as an option for VIFD™ or a sound card required for CC for IDFIS™).  Other options are Quiet and Beep.

Set the Log mode to ON to record every intermittent event as an individual line entry onto a dedicated log file; this data can then be used for compilation into the UUT Results Report Summary.  If set to OFF, all the intermittent events are simply summaries by test point.  The Log interval is in seconds, and logs the data to an external file at the interval set.  The default is set at 5secs.

Set the maximum voltage to be used in Diode Testing Profiles; it is recommended to use 1v as the default to ensure that sensitive components are not damaged inadvertently.

For legacy Intermittence and Point2Point applications pre Ver1.232

Set the reports required by each specific test.  If set to YES, a report will be generated by the relevant test program and will be available for the User to compile into a summary report for the UUT, including the UUT SerNo, Operator and Date/Time of test; see Results for more details.  All applications post Ver1.232, will always create csv files of all test data and capture to pdf, regardless of the settings set here.

Set the default Shorts Threshold levels in Ohms for the Shorts Testing.

Click to Exit from Test Parameter and return to the calling form.

Click to reset all the Test Parameters to the default settings.

There is an option to fit a Huntron Tracker to certain models of  IFD™ TE, especially VIFD™.  When a Tracker is fitted, or the Tracker application is run in simulated mode, the User can create Test Profiles.  These newly added Test Profiles will be initially created with the defaults set here.  If these defaults are changed, then existing Test Profiles are not affected.

There is an option to fit a Livewire SSTDR to certain models of  IFD™ TE, especially VIFD™.  When a SSTDR is fitted, or the SSTDR application is run in simulated mode, the User can create Test Profiles.  These newly added Test Profiles will be initially created with the defaults set here.  If these defaults are changed, then existing Test Profiles are not affected.

All models of  IFD™ TE will be deployed with a DMM capability.  When a UUT has TPs added, they will automatically be assigned a default Test Profile called CON-Default.  This Test Profile, and any subsequent continuity Test Profiles added to a specific TP, will initially have their profile parameter set to the defaults that are set here.  If these defaults are changed, then existing Test Profiles are not affected.

Select this tab, and enter in the blue field, notes that may be particular for the UUT, and its associated testing parameters.

Selecting the Test Options tab allows the User to change the settings and options for a range of different tests.

This only affects legacy applications pre Ver1.232