ContinuityThis test provides the ability to take DC ohmic measurements from any connected test point to any other programmed and connected test point using a DMM set to ohms. The DMM, which can be either integrated into the unit such as in the VIFD™ or connected as a peripheral device via the unit's BNC/Lema connectors located on the rear panel for the IDFIS™ or the front panel of the Legacy Portable.
A default Test Profile for a basic Continuity test is pre-programmed for each test point as it is added to the UUT; this Test Profile is called CON-Default. This default Test Profile is defined such that the UUT is broken down into separate nodes, where each node is a common connection point within an electrical/electronic circuit. Continuity testing of the UUT is performed on a nodal basis where each individual branch of the node is tested in sequence and its individual ohmic value is then compared to its value stored in the ‘Gold' file for that specific Test Profile for the UUT.
Other Continuity Test Profiles can also be added by the User and included automatically in to the Continuity Test; these test profiles can include a range of different test parameters designed for each test point, and can include testing against single or multiple test points across various nodes under a User defined test profile.
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