LogScope™

 

This point to point testing mode allows the User to see the degree of noise/ohmic variation between two selected test points, either based on defined Test Profiles, or as adhoc User selected Test Points.  This diagnostic testing mode performs trend logging of ohmic measurements over time using the switching capabilities of the IFD™ TE to switch 2 discrete test points to the connected DMM.  The LogScope™ application controls the connected DMM to take DC ohmic measurements at predetermined time-intervals, and it then plots these readings on an interactive chart.  The chart plots are designed to provide current, gold and changes measurements to help the User to identify measurement drift or transient faults.  All tests can be saved as a new Test Profile or existing Test Profiles updated.  All results are saved in csv or captured in pdf format for future post-test analysis.