Summary of Functions
The IFD™ Technology is controlled using a x86 based architecture PC which uses either the WindowsXP OS, mainly for Legacy Portable & Legacy Rack-Mounted systems, and then the Windows7/10 OS for recent versions of the technology such as the IDFIS™ and VIFD™.
A suite of software applications called NODES™ is used to run the various test functions and is used to manage the Unit Under Test (UUT) associated data, including key configurations data and specific test results.
IFD™ has an array of tests that cover a spectrum of testing methodologies, with its primary ability being the testing of electrical and electronic circuits for intermittent faults. Listed below are the key tests performed by the IFD™ Technology that can be used to detect and more importantly isolate detected faults. The testing modes are split into two areas:
Ø Neural Network Testing
Ø Point to Point Testing
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SSTDR
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Tracker
A detailed breakdown of the tests available and their full operation is contained in the ‘How to Test’ topic of this User Manual.